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Nanotechnology for the Tip-Surface Interface

In the mid-1980’s, researchers first discovered that tips could image surfaces with atomic resolution and move individual atoms on a surface.  Since then, scanning probe microscopy and nano-manipulation applications have grown exponentially and the need for enhanced tips is greater than ever.

Our mission is to create needles and tips that provide superior tip-surface contacts.  Tiptek’s probes and needles give high resolution, long life, and robust tip-surface interactions in the following three applications:

SEMICONDUCTOR FAULT DETECTION
SCANNING TUNNELING MICROSCOPY
ATOMICALLY PRECISE MANUFACTURING
Discover ultimate precision using Tiptek's cutting-edge scanning tunneling microscope (STM) probes produced using advanced Tiptek techniques. Lithography and imaging courtesy of Zyvex Labs.

NEWS

Tiptek Selected for Illinois Innovation Voucher Award
February 5, 2026

Tiptek is pleased to announce that it has been selected as an award recipient Continue reading

New Distributor in South Korea
March 14, 2025

We are excited to announce that Korea ITS (KITS) is now an official distributor Continue reading

Tiptek is Now ISO 9001:2015 certified!
February 10, 2025

We’re excited to announce that Tiptek is now ISO 9001:2015 certified!

ISO 9001:2015 is a Continue reading

EVENTS

 

CAM Workshop 2025

Halle, Germany
May 20 & 21, 2025

Penang, Malaysia
August 5 - 8, 2025

ISTFA 2025

Pasadena, CA, USA
November 16 - 20, 2025